Yang Leng, "Materials Characterization: Introduction to Microscopic and Spectroscopic Methods"
Wiley | 2008 | IN: 0470822988 | 384 pages | PDF | 5 MB
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical ysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, tranission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface ysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal ysis are also covered.
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